Paper Title:
Defect Profiling with Low Energy Positrons of Nitrogen Implanted Silicon
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 255-257)
Edited by
Y. C. Jean, Morten Eldrup, David M. Schrader, Roy N. West
Pages
500-502
DOI
10.4028/www.scientific.net/MSF.255-257.500
Citation
D.P. van der Werf, A.S. Saleh, A. Towner, M. Nathwani, J. A. Taylor, P.C. Rice-Evans, S.J. Bull, "Defect Profiling with Low Energy Positrons of Nitrogen Implanted Silicon", Materials Science Forum, Vols. 255-257, pp. 500-502, 1997
Online since
September 1997
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.