Paper Title:
Study of Point Defects in Silicon by Means of Positron Annihilation with Core Electrons
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 255-257)
Edited by
Y. C. Jean, Morten Eldrup, David M. Schrader, Roy N. West
Pages
605-607
DOI
10.4028/www.scientific.net/MSF.255-257.605
Citation
J. Kuriplach, T. van Hoecke, B. van Waeyenberge, C. Dauwe, D. Segers, N. Balcaen, A.L. Morales, M.-A. Trauwaert, J.R. Richardson, M. Šob, "Study of Point Defects in Silicon by Means of Positron Annihilation with Core Electrons", Materials Science Forum, Vols. 255-257, pp. 605-607, 1997
Online since
September 1997
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