Paper Title:
Depth Profiling of Defects in Argon Irradiated Silicon Using Positron Beam Facility at Kalpakkam
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 255-257)
Edited by
Y. C. Jean, Morten Eldrup, David M. Schrader, Roy N. West
Pages
650-652
DOI
10.4028/www.scientific.net/MSF.255-257.650
Citation
G. Amarendra, G. Venugopal Rao, K.G.M. Nair, B. Viswanathan, "Depth Profiling of Defects in Argon Irradiated Silicon Using Positron Beam Facility at Kalpakkam", Materials Science Forum, Vols. 255-257, pp. 650-652, 1997
Online since
September 1997
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.