Paper Title:
Interfacial Mixing in Al-Ge Thin Film Junction Studied by Variable Low Energy Positron Beam
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 255-257)
Edited by
Y. C. Jean, Morten Eldrup, David M. Schrader, Roy N. West
Pages
692-694
DOI
10.4028/www.scientific.net/MSF.255-257.692
Citation
G. Venugopal Rao, G. Raghavan, G. Amarendra, A.K. Tyagi, B. Viswanathan, "Interfacial Mixing in Al-Ge Thin Film Junction Studied by Variable Low Energy Positron Beam", Materials Science Forum, Vols. 255-257, pp. 692-694, 1997
Online since
September 1997
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