Paper Title:
Two-Detector Doppler Broadening Profiles in Al
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 255-257)
Edited by
Y. C. Jean, Morten Eldrup, David M. Schrader, Roy N. West
Pages
784-786
DOI
10.4028/www.scientific.net/MSF.255-257.784
Citation
P.E. Mijnarends, A.C. Kruseman, A. van Veen, V.J. Ghosh, P. Asoka-Kumar, A. Bansil, S. Kaprzyk, K. G. Lynn, "Two-Detector Doppler Broadening Profiles in Al", Materials Science Forum, Vols. 255-257, pp. 784-786, 1997
Online since
September 1997
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Price
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