Paper Title:
Defect Characterization of II-VI Compound Semiconductors Using Positron Lifetime Spectroscopy
  Abstract

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Periodical
Materials Science Forum (Volumes 258-263)
Edited by
Gordon Davies and Maria Helena Nazaré
Pages
1335-1340
DOI
10.4028/www.scientific.net/MSF.258-263.1335
Citation
G. Tessaro, P. Mascher, "Defect Characterization of II-VI Compound Semiconductors Using Positron Lifetime Spectroscopy", Materials Science Forum, Vols. 258-263, pp. 1335-1340, 1997
Online since
December 1997
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