Gold-Related Levels in Relaxed Si1-xGex Alloy Layers: A Study of the Pinning Effect |
| Journal |
Materials Science Forum (Volumes 258 - 263) |
| Volume |
Defects in Semiconductors 19 |
| Edited by |
Gordon Davies and Maria Helena Nazaré |
| Pages |
145-150 |
| DOI |
10.4028/www.scientific.net/MSF.258-263.145 |
| Citation |
A. Mesli et al., 1997, Materials Science Forum, 258-263, 145 |
| Authors |
A. Mesli, P. Kringhøj, Arne Nylandsted Larsen |
| Keywords |
Deep Level, DLTS, SiGe Alloys, Silicon, Transition Metal |
| Full Paper |
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