Schottky Diodes on Si1-x-yGexCy Alloys: Measurement of Band Off-Set by DLTS |
| Journal |
Materials Science Forum (Volumes 258 - 263) |
| Volume |
Defects in Semiconductors 19 |
| Edited by |
Gordon Davies and Maria Helena Nazaré |
| Pages |
165-170 |
| DOI |
10.4028/www.scientific.net/MSF.258-263.165 |
| Citation |
M. Serpentini et al., 1997, Materials Science Forum, 258-263, 165 |
| Authors |
M. Serpentini, G. Brémond |
| Keywords |
Band-Offset, DLTS, Schottky Contact, Si1-x-yGexCy, Strain, Tungstene |
| Full Paper |
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