Paper Title:
Shallow Thermal Donors in Annealed CZ Silicon and Links to the NL10 EPR Spectrum: The Relevance of H, Al and N Impurities
| Periodical | Materials Science Forum (Volumes 258 - 263) |
|---|---|
| Main Theme | Defects in Semiconductors 19 |
| Edited by | Gordon Davies and Maria Helena Nazaré |
| Pages | 379-384 |
| DOI | 10.4028/www.scientific.net/MSF.258-263.379 |
| Citation | R.C. Newman et al., 1997, Materials Science Forum, 258-263, 379 |
| Authors | R.C. Newman, M.J. Ashwin, R.E. Pritchard, J.H. Tucker, Edward C. Lightowlers, T. Gregorkiewicz, I.S. Zevenbergen, C.A.J. Ammerlaan, Robert J. Falster, M.J. Binns |
| Keywords | Electron Paramagnetic Resonance (EPR), Infrared Absorption, Oxygen, Shallow Thermal Donors, Silicon |
| Price | US$ 28,- |
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