Paper Title:
Cadmium-Related Defects in Silicon: Electron-Paramagnetic-Resonance Identification
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 258-263)
Edited by
Gordon Davies and Maria Helena Nazaré
Pages
423-428
DOI
10.4028/www.scientific.net/MSF.258-263.423
Citation
W. Gehlhoff, A. Näser, M. Lang, G. Pensl, "Cadmium-Related Defects in Silicon: Electron-Paramagnetic-Resonance Identification", Materials Science Forum, Vols. 258-263, pp. 423-428, 1997
Online since
December 1997
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Price
$32.00
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