Paper Title:
Performance Degradation of Microcrystalline Silicon-Based p-i-n Detectors Upon He4 Irradiation
  Abstract

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Periodical
Materials Science Forum (Volumes 258-263)
Edited by
Gordon Davies and Maria Helena Nazaré
Pages
593-598
DOI
10.4028/www.scientific.net/MSF.258-263.593
Citation
R. Schwarz, M. Vieira, F. Maçarico, S. Koynov, S. Cardoso, J.C. Soares, "Performance Degradation of Microcrystalline Silicon-Based p-i-n Detectors Upon He4 Irradiation", Materials Science Forum, Vols. 258-263, pp. 593-598, 1997
Online since
December 1997
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