Paper Title:
Raman Scattering Measurements in Neutron-Irradiated Silicon
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 258-263)
Edited by
Gordon Davies and Maria Helena Nazaré
Pages
623-628
DOI
10.4028/www.scientific.net/MSF.258-263.623
Citation
M. Coeck, C. Laermans, R. Provoost, R.E. Silverans, "Raman Scattering Measurements in Neutron-Irradiated Silicon", Materials Science Forum, Vols. 258-263, pp. 623-628, 1997
Online since
December 1997
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.