Paper Title:
Traps Found in GaAs MESFETs: Properties Location and Detection
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 258-263)
Edited by
Gordon Davies and Maria Helena Nazaré
Pages
933-938
DOI
10.4028/www.scientific.net/MSF.258-263.933
Citation
B.K. Jones, M.A. Iqbal, "Traps Found in GaAs MESFETs: Properties Location and Detection", Materials Science Forum, Vols. 258-263, pp. 933-938, 1997
Online since
December 1997
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Price
$32.00
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