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Defects in Thick Epitaxial GaAs Layers

Journal Materials Science Forum (Volumes 258 - 263)
Volume Defects in Semiconductors 19
Edited by Gordon Davies and Maria Helena Nazaré
Pages 997-1002
DOI 10.4028/www.scientific.net/MSF.258-263.997
Citation H. Samie et al., 1997, Materials Science Forum, 258-263, 997
Authors H. Samie, J.C. Bourgoin
Keywords EL2, GaAs, Growth, Hall-Effect, IR Absorption, Luminescence, SIMS, VPE
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