Paper Title:
Growth and Characterisation of Thick SiC Epilayers by High Temperature CVD
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 264-268)
Edited by
G. Pensl, H. Morkoç, B. Monemar and E. Janzén
Pages
103-106
DOI
10.4028/www.scientific.net/MSF.264-268.103
Citation
A. Ellison, T. Kimoto, I. G. Ivanov, Q. Wahab, A. Henry, O. Kordina, J. H. Zhang, C. G. Hemmingsson, C.-Y. Gu, M.R. Leys, E. Janzén, "Growth and Characterisation of Thick SiC Epilayers by High Temperature CVD", Materials Science Forum, Vols. 264-268, pp. 103-106, 1998
Online since
February 1998
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.