Paper Title:
The Atomic Structure of Prismatic Planar Defects in GaN/AlN Grown over Silicon Carbide and Sapphire Substrates
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 264-268)
Edited by
G. Pensl, H. Morkoç, B. Monemar and E. Janzén
Pages
1247-1250
DOI
10.4028/www.scientific.net/MSF.264-268.1247
Citation
G. Nouet, P. Vermaut, V. Potin, P. Ruterana, A. Salvador, H. Morkoç, "The Atomic Structure of Prismatic Planar Defects in GaN/AlN Grown over Silicon Carbide and Sapphire Substrates", Materials Science Forum, Vols. 264-268, pp. 1247-1250, 1998
Online since
February 1998
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