Paper Title:
Analysis of Reflectivity Measurements for GaN Films Grown on GaAs: Influence of Surface Roughness and Interface Layers
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 264-268)
Edited by
G. Pensl, H. Morkoç, B. Monemar and E. Janzén
Pages
1347-1350
DOI
10.4028/www.scientific.net/MSF.264-268.1347
Citation
S. Shokhovets, R. Goldhahn, V. Cimalla, T.S. Cheng, C.T. Foxon, "Analysis of Reflectivity Measurements for GaN Films Grown on GaAs: Influence of Surface Roughness and Interface Layers", Materials Science Forum, Vols. 264-268, pp. 1347-1350, 1998
Online since
February 1998
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.