Paper Title:
Photoluminescence and Raman Scattering Characterization of GaN, InGaN and AlGaN Films Using a UV Excitation Raman-Photoluminescence Microscope
  Abstract

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Periodical
Materials Science Forum (Volumes 264-268)
Edited by
G. Pensl, H. Morkoç, B. Monemar and E. Janzén
Pages
1359-1362
DOI
10.4028/www.scientific.net/MSF.264-268.1359
Citation
Z. C. Feng, M. Schurman, C.A. Tran, T. Salagaj, B. Karlicek, I. T. Ferguson, R.A. Stall, C.D. Dyer, K.P.J. Williams, G.D. Pitt, "Photoluminescence and Raman Scattering Characterization of GaN, InGaN and AlGaN Films Using a UV Excitation Raman-Photoluminescence Microscope", Materials Science Forum, Vols. 264-268, pp. 1359-1362, 1998
Online since
February 1998
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$32.00
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