Paper Title:
Polytype and Surface Characterization of Silicon Carbide Thin Films
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 264-268)
Edited by
G. Pensl, H. Morkoç, B. Monemar and E. Janzén
Pages
355-358
DOI
10.4028/www.scientific.net/MSF.264-268.355
Citation
B. Schröter, M. Kreuzberg, A. Fissel, K. Pfennighaus, W. Richter, "Polytype and Surface Characterization of Silicon Carbide Thin Films", Materials Science Forum, Vols. 264-268, pp. 355-358, 1998
Online since
February 1998
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Price
$32.00
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