Paper Title:
High Resolution Photoemission Study of the 6H-SiC/SiO2 Interface
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 264-268)
Edited by
G. Pensl, H. Morkoç, B. Monemar and E. Janzén
Pages
375-378
DOI
10.4028/www.scientific.net/MSF.264-268.375
Citation
B. Mattern, M. Bassler, G. Pensl, L. Ley, "High Resolution Photoemission Study of the 6H-SiC/SiO2 Interface", Materials Science Forum, Vols. 264-268, pp. 375-378, 1998
Online since
February 1998
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Price
$32.00
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