Paper Title:
High Resolution Photoemission Spectroscopy Using Synchrotron Radiation Study of the SiO2/β-SiC(100)3x2 Interface Composition
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 264-268)
Edited by
G. Pensl, H. Morkoç, B. Monemar and E. Janzén
Pages
391-394
DOI
10.4028/www.scientific.net/MSF.264-268.391
Citation
D. Dunham, P. Soukiassian, J.D. Denlinger, B.P. Tonner, E. Rothenberg, "High Resolution Photoemission Spectroscopy Using Synchrotron Radiation Study of the SiO2/β-SiC(100)3x2 Interface Composition", Materials Science Forum, Vols. 264-268, pp. 391-394, 1998
Online since
February 1998
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Price
$32.00
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