Paper Title:
Extended Defects in SiC and GaN Semiconductors
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 264-268)
Edited by
G. Pensl, H. Morkoç, B. Monemar and E. Janzén
Pages
399-408
DOI
10.4028/www.scientific.net/MSF.264-268.399
Citation
P. Pirouz, "Extended Defects in SiC and GaN Semiconductors", Materials Science Forum, Vols. 264-268, pp. 399-408, 1998
Online since
February 1998
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Price
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