Extended Defects in SiC and GaN Semiconductors |
| Journal |
Materials Science Forum (Volumes 264 - 268) |
| Volume |
Silicon Carbide, III-Nitrides and Related Materials |
| Edited by |
G. Pensl, H. Morkoç, B. Monemar and E. Janzén |
| Pages |
399-408 |
| DOI |
10.4028/www.scientific.net/MSF.264-268.399 |
| Citation |
P. Pirouz, 1998, Materials Science Forum, 264-268, 399 |
| Online since |
February, 1998 |
| Authors |
P. Pirouz |
| Keywords |
Defect, Dislocation, Galium Nitride (GaN), Inversion Domains, Polytype, Silicon Carbide (SiC), Stacking Fault |
| Full Paper |
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