Paper Title:
Investigation of Polymorphism and Estimation of Lattice Constants of SiC Epilayers by Four Circle X-Ray Diffraction
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 264-268)
Edited by
G. Pensl, H. Morkoç, B. Monemar and E. Janzén
Pages
437-440
DOI
10.4028/www.scientific.net/MSF.264-268.437
Citation
H. Romanus, G. Teichert, L. Spieß, "Investigation of Polymorphism and Estimation of Lattice Constants of SiC Epilayers by Four Circle X-Ray Diffraction", Materials Science Forum, Vols. 264-268, pp. 437-440, 1998
Online since
February 1998
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Price
$32.00
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