Paper Title:
Infrared Reflectance of Extremely Thin AlN Epi-Films Deposited on SiC Substrates
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 264-268)
Edited by
G. Pensl, H. Morkoç, B. Monemar and E. Janzén
Pages
649-652
DOI
10.4028/www.scientific.net/MSF.264-268.649
Citation
M. F. MacMillan, U. Forsberg, P.O.Å. Persson, L. Hultman, E. Janzén, "Infrared Reflectance of Extremely Thin AlN Epi-Films Deposited on SiC Substrates", Materials Science Forum, Vols. 264-268, pp. 649-652, 1998
Online since
February 1998
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