Paper Title:
Contactless Measurement of the Thermal Conductivity of Thin SiC Layers
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 264-268)
Edited by
G. Pensl, H. Morkoç, B. Monemar and E. Janzén
Pages
657-660
DOI
10.4028/www.scientific.net/MSF.264-268.657
Citation
S. Rohmfeld, M. Hundhausen, L. Ley, "Contactless Measurement of the Thermal Conductivity of Thin SiC Layers", Materials Science Forum, Vols. 264-268, pp. 657-660, 1998
Online since
February 1998
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.