Paper Title:
Cross-Sectional Micro-Raman Spectroscopy: A Tool for Structural Investigations of Thin Polytypic SiC Layers
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 264-268)
Edited by
G. Pensl, H. Morkoç, B. Monemar and E. Janzén
Pages
661-664
DOI
10.4028/www.scientific.net/MSF.264-268.661
Citation
T. Werninghaus, D.R.T. Zahn, R.A. Yankov, A. Mücklich, J. Pezoldt, "Cross-Sectional Micro-Raman Spectroscopy: A Tool for Structural Investigations of Thin Polytypic SiC Layers", Materials Science Forum, Vols. 264-268, pp. 661-664, 1998
Online since
February 1998
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Price
$32.00
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