Secondary Extinction Used in Thickness and Pole Density Measurements of Textured Films by X-Ray Diffraction |
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| Journal | Materials Science Forum (Volumes 273 - 275) |
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| Volume | Texture and Anisotropy of Polycrystals |
| Edited by | R.A. Schwarzer |
| Pages | 145-150 |
| DOI | 10.4028/www.scientific.net/MSF.273-275.145 |
| Citation | I. Tomov, 1998, Materials Science Forum, 273-275, 145 |
| Authors | I. Tomov |
| Keywords | Extinction, Pole Density, Texture, Thickness, Thin Film, X-Ray Diffraction (XRD) |
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