Paper Title:
Secondary Extinction Used in Thickness and Pole Density Measurements of Textured Films by X-Ray Diffraction
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 273-275)
Edited by
R.A. Schwarzer
Pages
145-150
DOI
10.4028/www.scientific.net/MSF.273-275.145
Citation
I. Tomov, "Secondary Extinction Used in Thickness and Pole Density Measurements of Textured Films by X-Ray Diffraction", Materials Science Forum, Vols. 273-275, pp. 145-150, 1998
Online since
February 1998
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Price
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