Orientationally Resolved Grain Size Distributions in Thin Films |
| Journal |
Materials Science Forum (Volumes 273 - 275) |
| Volume |
Texture and Anisotropy of Polycrystals |
| Edited by |
R.A. Schwarzer |
| Pages |
237-242 |
| DOI |
10.4028/www.scientific.net/MSF.273-275.237 |
| Citation |
J. Greiser et al., 1998, Materials Science Forum, 273-275, 237 |
| Authors |
J. Greiser, Peter Müllner, E. Arzt |
| Keywords |
Electron Backscatter Diffraction (EBSD), Grain Growth, Nickel Thin Film, Statistics, Texture |
| Full Paper |
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