Future Trends: Texture Analysis for Structure-Sensitive Properties |
| Journal |
Materials Science Forum (Volumes 273 - 275) |
| Volume |
Texture and Anisotropy of Polycrystals |
| Edited by |
R.A. Schwarzer |
| Pages |
29-40 |
| DOI |
10.4028/www.scientific.net/MSF.273-275.29 |
| Citation |
Brent L. Adams et al., 1998, Materials Science Forum, 273-275, 29 |
| Authors |
Brent L. Adams, Dorte Juul Jensen, Henning Friis Poulsen, R.M. Suter |
| Keywords |
Grain Boundary, Microstructure, Residual Strains, Structure-Sensitive Properties, X-Ray Diffraction (XRD) |
| Full Paper |
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