Paper Title:
Simultaneous Analysis of the Small- and Wide-Angle Scattering from Nanometric SiC Based on the ab initio Pattern Simulation
  Abstract

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Periodical
Materials Science Forum (Volumes 278-281)
Edited by
R. Delhez and E.J. Mittemeijer
Pages
106-109
DOI
10.4028/www.scientific.net/MSF.278-281.106
Citation
S. Gierlotka, B. F. Palosz, R. Pielaszek, S. Stelmakh, S. Doyle, T. Wroblewski, "Simultaneous Analysis of the Small- and Wide-Angle Scattering from Nanometric SiC Based on the ab initio Pattern Simulation", Materials Science Forum, Vols. 278-281, pp. 106-109, 1998
Online since
April 1998
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