Paper Title:
Use of Sliding-Window Fourier Transform in the Analysis of X-Ray Reflectivity Data
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 278-281)
Edited by
R. Delhez and E.J. Mittemeijer
Pages
170-176
DOI
10.4028/www.scientific.net/MSF.278-281.170
Citation
R. Smigiel, A. Knoll, N. Broll, A. Cornet, "Use of Sliding-Window Fourier Transform in the Analysis of X-Ray Reflectivity Data", Materials Science Forum, Vols. 278-281, pp. 170-176, 1998
Online since
April 1998
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Price
$32.00
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