Paper Title:
A Computer Program for Structural Refinement from Thin Film XRD Patterns
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 278-281)
Edited by
R. Delhez and E.J. Mittemeijer
Pages
177-183
DOI
10.4028/www.scientific.net/MSF.278-281.177
Citation
M. Leoni, P. Scardi, "A Computer Program for Structural Refinement from Thin Film XRD Patterns", Materials Science Forum, Vols. 278-281, pp. 177-183, 1998
Online since
April 1998
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.