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Weighting Scheme for the Minimization Function in Rietveld Refinement and the Accuracy of Structural Parameters

Journal Materials Science Forum (Volumes 278 - 281)
Volume European Powder Diffraction 5
Edited by R. Delhez and E.J. Mittemeijer
Pages 20-25
DOI 10.4028/www.scientific.net/MSF.278-281.20
Citation H. Toraya, 1998, Materials Science Forum, 278-281, 20
Authors H. Toraya
Keywords Accuracy of Structural Parameters, Rietveld Method, Weighted Difference Plots, Weighting Scheme
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