A New Approach for Getting Refined X-Ray Diffraction Patterns by Using X-Ray Diffractometers with Energy Resolving Detectors |
| Journal |
Materials Science Forum (Volumes 278 - 281) |
| Volume |
European Powder Diffraction 5 |
| Edited by |
R. Delhez and E.J. Mittemeijer |
| Pages |
221-226 |
| DOI |
10.4028/www.scientific.net/MSF.278-281.221 |
| Citation |
D.C. Meyer et al., 1998, Materials Science Forum, 278-281, 221 |
| Authors |
D.C. Meyer, P. Gawlitza, A. Seidel, K. Richter, P. Paufler |
| Keywords |
Device Function, Energy Resolving Detectors, X-Ray Diffraction (XRD) |
| Full Paper |
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