Paper Title:
A New Approach for Getting Refined X-Ray Diffraction Patterns by Using X-Ray Diffractometers with Energy Resolving Detectors
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 278-281)
Edited by
R. Delhez and E.J. Mittemeijer
Pages
221-226
DOI
10.4028/www.scientific.net/MSF.278-281.221
Citation
D.C. Meyer, P. Gawlitza, A. Seidel, K. Richter, P. Paufler, "A New Approach for Getting Refined X-Ray Diffraction Patterns by Using X-Ray Diffractometers with Energy Resolving Detectors", Materials Science Forum, Vols. 278-281, pp. 221-226, 1998
Online since
April 1998
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Price
$32.00
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