Paper Title:
Rietveld Analysis of Disordered Layer Silicates
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 278-281)
Edited by
R. Delhez and E.J. Mittemeijer
Pages
300-305
DOI
10.4028/www.scientific.net/MSF.278-281.300
Citation
J. Bergmann, R. Kleeberg, "Rietveld Analysis of Disordered Layer Silicates", Materials Science Forum, Vols. 278-281, pp. 300-305, 1998
Online since
April 1998
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Price
$32.00
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