Paper Title:
Microstructural Characterization of Nanocrystalline Thin Films by Grazing Incidence Diffraction: Au and Tb0.3Dy0.7Fe2 (Terfenol-D)
  Abstract

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Periodical
Materials Science Forum (Volumes 278-281)
Edited by
R. Delhez and E.J. Mittemeijer
Pages
460-465
DOI
10.4028/www.scientific.net/MSF.278-281.460
Citation
A. Skokan, P. von Blanckenhagen, E. Quandt, M. Walter, "Microstructural Characterization of Nanocrystalline Thin Films by Grazing Incidence Diffraction: Au and Tb0.3Dy0.7Fe2 (Terfenol-D)", Materials Science Forum, Vols. 278-281, pp. 460-465, 1998
Online since
April 1998
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Price
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