Structural Studies of Submicron Grained Copper, Germanium and Silicon |
| Journal |
Materials Science Forum (Volumes 278 - 281) |
| Volume |
European Powder Diffraction 5 |
| Edited by |
R. Delhez and E.J. Mittemeijer |
| Pages |
496-501 |
| DOI |
10.4028/www.scientific.net/MSF.278-281.496 |
| Citation |
Radomír Kužel et al., 1998, Materials Science Forum, 278-281, 496 |
| Authors |
Radomír Kužel, Rinat K. Islamgaliev, František Chmelík |
| Keywords |
Copper (Cu), Germanium, Silicon, Submicron Grained Materials, XRD Line Broadening Analysis |
| Full Paper |
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