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Quantitative Analysis of Silicate Glass in Ceramic Materials by the Rietveld Method

Journal Materials Science Forum (Volumes 278 - 281)
Volume European Powder Diffraction 5
Edited by R. Delhez and E.J. Mittemeijer
Pages 87-92
DOI 10.4028/www.scientific.net/MSF.278-281.87
Citation Luca Lutterotti et al., 1998, Materials Science Forum, 278-281, 87
Authors Luca Lutterotti, R. Ceccato, R. Dal Maschio, E. Pagani
Keywords Amorphous, Quantitative Analysis, Rietveld Method, Silica-Glass, X-Ray Diffraction (XRD)
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