Paper Title:
Structural Characterization of Cu Metallic Clusters in Amorphous SiO2 by Synchrotron Radiation Grazing Incidence X-Ray Scattering and Diffraction
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Periodical
Materials Science Forum (Volumes 278-281)
Edited by
R. Delhez and E.J. Mittemeijer
Pages
891-897
DOI
10.4028/www.scientific.net/MSF.278-281.891
Citation
F. D'Acapito, D. Thiaudière, F. Zontone, J.R. Regnard, "Structural Characterization of Cu Metallic Clusters in Amorphous SiO2 by Synchrotron Radiation Grazing Incidence X-Ray Scattering and Diffraction", Materials Science Forum, Vols. 278-281, pp. 891-897, 1998
Online since
April 1998
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