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European Powder Diffraction 5

Materials Science Forum Volumes 278 - 281

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• p216 Mapping in Real and Reciprocal Space   [ 307 K ]
  Authors: Thomas Wroblewski, D. Breuer, H.A. Crostack, F. Fandrich, M. Gross, P. Klimanek
• p221 A New Approach for Getting Refined X-Ray Diffraction Patterns by Using X-Ray Diffractometers with Energy Resolving Detectors   [ 298 K ]
  Authors: D.C. Meyer, P. Gawlitza, A. Seidel, K. Richter, P. Paufler
• p227 X-Ray Optics for Materials Research   [ 421 K ]
  Authors: V.A. Kogan, J. Bethke
• p236 Multifiber Polycapillary Collimator for X-Ray Powder Diffraction   [ 402 K ]
  Authors: Q.F. Xiao, R. J. Kennedy, T.W. Ryan, B.R. York
• p242 Measurements in Parallel-Beam Geometry Achieved by a Göbel Mirror at a Laboratory Source   [ 306 K ]
  Authors: M. Gross, S. Haaga, H. Heitzek, Mathias Herrmann, W. Engel
• p248 High Temperature X-Ray Diffraction: Uncertainties in Temperature Measurement and Intensity Limitations   [ 273 K ]
  Authors: W. Pitschke, A. Teresiak
• p254 Temperature Distribution at the Sample Surface in High-Temperature XRD Using Infrared Thermography   [ 457 K ]
  Authors: W. Fischer, P. Lersch
• p260 A New High-Temperature Furnace Chamber   [ 137 K ]
  Authors: E.B. Fantner, B. Koppelhuber-Bitschnau, F.A. Mautner, P. Doppler, J. Gautsch
• p264 In Situ Heat Treatment Structural Studies with Curved Detector   [ 216 K ]
  Authors: F. Muller, I. Rannou
• p270 In Situ X-Ray Diffraction Analyses of Catalytic Reactions and Moderate-Pressure Geological Processes   [ 530 K ]
  Authors: T.B. Žunić, G. Steffensen, J. Villadsen
• p278 Standard Reference Materials for the Measurement of Instrument Resolution Functions: Effect of Transparency   [ 224 K ]
  Authors: J.I. Langford, Matteo Leoni, Paolo Scardi
• p284 Toward EXPO: From the Powder Pattern to the Crystal Structure   [ 220 K ]
  Authors: Angela Altomare, M.C. Burla, Mercedes Camalli, B. Carrozzini, G. Cascarano, Carmelo Giacovazzo, A. Guagliardi, A.G.G. Moliterni, G. Polidori, R. Rizzi
• p289 Solving Crystal Structures from Powder Data: The Use of a Molecular Fragment   [ 164 K ]
  Authors: Angela Altomare, Carmelo Giacovazzo, A. Guagliardi, A.G.G. Moliterni
• p294 Crystal Structure Determination from Powder Diffraction Data by the Application of a Genetic Algorithm   [ 209 K ]
  Authors: R. Csoka, W.I.F. David, K. Shankland
• p300 Rietveld Analysis of Disordered Layer Silicates   [ 301 K ]
  Authors: J. Bergmann, R. Kleeberg