Optical Characterization of Mercury Cadmium Telluride Epitaxial Layers with Arbitrary Degree of Carrier Degeneracy |
| Journal |
Materials Science Forum (Volumes 282 - 283) |
| Volume |
Advanced Materials and Processes |
| Edited by |
Dragan P. Uskokovic, Slobodan K. Milonjic, Dejan I. Rakovic |
| Pages |
131-138 |
| DOI |
10.4028/www.scientific.net/MSF.282-283.131 |
| Citation |
Z. Djurić et al., 1998, Materials Science Forum, 282-283, 131 |
| Authors |
Z. Djurić, Z.M. Jakšić, Z. Djinović, V. Jović |
| Keywords |
Epitaxial Growth, Materials in Electronics, Mercury Cadmium Telluride |
| Full Paper |
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