Paper Title:
Characterization of As Implanted Silicides by Frequency Noise Level Measurements
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 282-283)
Edited by
Dragan P. Uskokovic, Slobodan K. Milonjic, Dejan I. Rakovic
Pages
153-156
DOI
10.4028/www.scientific.net/MSF.282-283.153
Citation
M. Stojanović, M. Milosavljević, C. Jeynes, "Characterization of As Implanted Silicides by Frequency Noise Level Measurements", Materials Science Forum, Vols. 282-283, pp. 153-156, 1998
Online since
May 1998
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Price
$32.00
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