Paper Title:
Crystallography and Microstructure of Thin Films Studied by X-Ray and Electron Diffraction
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 287-288)
Edited by
Horst Hoffmann
Pages
23-60
DOI
10.4028/www.scientific.net/MSF.287-288.23
Citation
R. A. Schwarzer, "Crystallography and Microstructure of Thin Films Studied by X-Ray and Electron Diffraction", Materials Science Forum, Vols. 287-288, pp. 23-60, 1998
Online since
August 1998
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Price
$32.00
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