Crystallography and Microstructure of Thin Films Studied by X-Ray and Electron Diffraction |
| Journal |
Materials Science Forum (Volumes 287 - 288) |
| Volume |
Trends and New Applications of Thin Films |
| Edited by |
Horst Hoffmann |
| Pages |
23-60 |
| DOI |
10.4028/www.scientific.net/MSF.287-288.23 |
| Citation |
Robert A. Schwarzer, 1998, Materials Science Forum, 287-288, 23 |
| Authors |
Robert A. Schwarzer |
| Keywords |
BKD, Crystal Texture, Electron Backscattered Pattern (EBSP), Grain Boundary, Kikuchi Patterns, Pole Figure, Resiudal Stresses, X-Ray Diffraction (XRD), X-Ray Fluorescence Analysis |
| Full Paper |
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