Crystallography and Microstructure of Thin Films Studied by X-Ray and Electron Diffraction |
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| Journal | Materials Science Forum (Volumes 287 - 288) |
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| Volume | Trends and New Applications of Thin Films |
| Edited by | Horst Hoffmann |
| Pages | 23-60 |
| DOI | 10.4028/www.scientific.net/MSF.287-288.23 |
| Authors | Robert A. Schwarzer |
| Keywords | BKD, Crystal Texture, Electron Backscattered Pattern (EBSP), Grain Boundary, Kikuchi Patterns, Pole Figure, Resiudal Stresses, X-Ray Diffraction (XRD), X-Ray Fluorescence Analysis |
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