Paper Title:
A New Method for the Optical Characterization of Inhomogeneous Thin Films Based Only on Spectroscopic Reflection Measurements
  Abstract

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Periodical
Materials Science Forum (Volumes 287-288)
Edited by
Horst Hoffmann
Pages
363-366
DOI
10.4028/www.scientific.net/MSF.287-288.363
Citation
J.J. Ruiz-Pérez, E. Márquez, J.M. González-Leal, D. Jiménez-Garay, D. Minkov, "A New Method for the Optical Characterization of Inhomogeneous Thin Films Based Only on Spectroscopic Reflection Measurements", Materials Science Forum, Vols. 287-288, pp. 363-366, 1998
Online since
August 1998
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