Surface and Thin Film Analysis with Electron and Mass Spectrometric Techniques
| Periodical | Materials Science Forum (Volumes 287 - 288) |
|---|---|
| Main Theme | Trends and New Applications of Thin Films |
| Edited by | Horst Hoffmann |
| Pages | 61-86 |
| DOI | 10.4028/www.scientific.net/MSF.287-288.61 |
| Citation | A. Wucher, 1998, Materials Science Forum, 287-288, 61 |
| Authors | A. Wucher |
| Keywords | Analysis, Electron Spectroscopy, Mass Spectroscopy |
| Price | US$ 28,- |