Paper Title:
Surface and Thin Film Analysis with Electron and Mass Spectrometric Techniques
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 287-288)
Edited by
Horst Hoffmann
Pages
61-86
DOI
10.4028/www.scientific.net/MSF.287-288.61
Citation
A. Wucher, "Surface and Thin Film Analysis with Electron and Mass Spectrometric Techniques", Materials Science Forum, Vols. 287-288, pp. 61-86, 1998
Online since
August 1998
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Price
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