Paper Title:

Surface and Thin Film Analysis with Electron and Mass Spectrometric Techniques

Periodical Materials Science Forum (Volumes 287 - 288)
Main Theme Trends and New Applications of Thin Films
Edited by Horst Hoffmann
Pages 61-86
DOI 10.4028/www.scientific.net/MSF.287-288.61
Citation A. Wucher, 1998, Materials Science Forum, 287-288, 61
Authors A. Wucher
Keywords Analysis, Electron Spectroscopy, Mass Spectroscopy
Price US$ 28,-
Article Preview
View full size