Surface and Thin Film Analysis with Electron and Mass Spectrometric Techniques |
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| Journal | Materials Science Forum (Volumes 287 - 288) |
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| Volume | Trends and New Applications of Thin Films |
| Edited by | Horst Hoffmann |
| Pages | 61-86 |
| DOI | 10.4028/www.scientific.net/MSF.287-288.61 |
| Citation | A. Wucher, 1998, Materials Science Forum, 287-288, 61 |
| Authors | A. Wucher |
| Keywords | Analysis, Electron Spectroscopy, Mass Spectroscopy |
| Full Paper | 
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