Paper Title:
Ellipsometric Characterization of Copper Deposits
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 289-292)
Edited by
Pier Luigi Bonora and Flavio Deflorian
Pages
465-470
DOI
10.4028/www.scientific.net/MSF.289-292.465
Citation
G. Sandmann, W.J. Plieth, G.I. Lacconi, M. López Teijelo, "Ellipsometric Characterization of Copper Deposits", Materials Science Forum, Vols. 289-292, pp. 465-470, 1998
Online since
August 1998
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Price
$32.00
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