Paper Title:
Characterization of Grain Boundaries of Al-doped Sintered β-SiC by Both HRTEM and STEM
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 294-296)
Edited by
Pavel Lejcek and Václav Paidar
Pages
269-272
DOI
10.4028/www.scientific.net/MSF.294-296.269
Citation
K. Kaneko, T. Saitoh, S. Tsurekawa, "Characterization of Grain Boundaries of Al-doped Sintered β-SiC by Both HRTEM and STEM", Materials Science Forum, Vols. 294-296, pp. 269-272, 1999
Online since
November 1998
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Price
$32.00
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