Optical Probing of Ultrafast Devices |
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| Journal | Materials Science Forum (Volumes 297 - 298) |
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| Volume | Ultrafast Phenomena in Semiconductors |
| Edited by | Steponas Asmontas and Adolfas Dargys |
| Pages | 59-66 |
| DOI | 10.4028/www.scientific.net/MSF.297-298.59 |
| Authors | H.G. Roskos, Tilo Pfeifer, H.-M. Heiliger, T. Löffler, H. Kurz |
| Keywords | Electrical Waveguides, Electrooptic Probing, Optoelectronic Circuit Characterization, Photoconductive Probing |
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