Atom-Scale Characterization of Ordered Alloys with Atom-Probe Field-Ion Microscope |
| Journal |
Materials Science Forum (Volumes 304 - 306) |
| Volume |
Towards Innovation in Superplasticity II |
| Edited by |
T. Sakuma, T. Aizawa, K. Higashi |
| Pages |
139-146 |
| DOI |
10.4028/www.scientific.net/MSF.304-306.139 |
| Citation |
M. Yamamoto, 1999, Materials Science Forum, 304-306, 139 |
| Authors |
M. Yamamoto |
| Keywords |
Atom Probe, Atom-Image, Atom-Scale Characterization, Boron, Domain Boundaries, Field Ion Microscopy, Interface Structure, Intermetallic, Ni4Mo, Ordered Alloy, Segregation |
| Full Paper |
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