Paper Title:
Examination of Si1-xGex Laterally Graded Crystals for Use in High Brilliance Synchrotron Beams
  Abstract

  Info
Periodical
Materials Science Forum (Volumes 308-311)
Edited by
W.A. Kaysser
Pages
597-602
DOI
10.4028/www.scientific.net/MSF.308-311.597
Citation
M. Veldkamp, A. Erko, F. Schäfers, W. Gudat, N.V. Abrosimov, V. Alex, S. Rossolenko, V. Shekhtman, E. Shulakov, S. Khasanov, I. Smirnova, "Examination of Si1-xGex Laterally Graded Crystals for Use in High Brilliance Synchrotron Beams", Materials Science Forum, Vols. 308-311, pp. 597-602, 1999
Online since
May 1999
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.